| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_343fc490b32eed6bb35835944292ad36
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5f5d1d4542296af9d0c2feae1d4b7036
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e757fd4fedc4fe825bb81b1b466a0947
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3a1cf411a8765ef66b7edf0843dbbdcb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2b1fb45deb73f8872f94341ce196308a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_05a6c7584bf7ad8f1b902d06cb5c70c9
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e898bcde7cb07ecdfb0772edcac8790a |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30148 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-256
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-001
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F15-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-00 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F15-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-00 |
| filingDate |
2012-04-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fde5b346fdf064b61ccbd806c44cf9a9
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bc5749ca670f05ba1f4d56b8ff7e896b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4dd3e2b22518924986504ef743e3152b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e1d2bd906bf65dfa43ca24fe611f9f63
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c79aa8bac0642cbb6415e1a1722374cd
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7450b1b14b8f4a6d4c184214eb0c161c |
| publicationDate |
2013-04-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2013103336-A1 |
| titleOfInvention |
Multi-modal data analysis for defect identification |
| abstract |
A technique for identifying a defect in an object produced by a controllable process is disclosed. A first type of data generated as a result of production of the object by the controllable process is obtained. A second type of data generated as a result of production of the object by the controllable process is obtained. The first type of data and the second type of data are jointly analyzed. A defect is identified in the object based on the joint analysis of the first type of data and the second type of data. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9222895-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9816939-B2 |
| priorityDate |
2008-01-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |