Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2f258ef9a5074c3e6b63f4ca42e4f0f6 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ab649a5ca727413adfbb59c1ad370ef2 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_83edecae09b4099139696ce37ad9eb56 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_33973a5bdbd020e5afa63c8dd5d2e9b9 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318511 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F17-18 |
filingDate |
2012-06-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ca664a83727cbe614ea9ce2081b7f236 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_714a8dff196b3927e8e20e1c754caaec http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dfe8cda0ff280f2b44e81efef68851f3 |
publicationDate |
2012-12-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-2012316803-A1 |
titleOfInvention |
Semiconductor test data analysis system |
abstract |
The invention concerns a system for processing semi-conductor test data relating to a plurality of dies formed by a manufacturing process on at least one silicon wafer, the system comprising: an input arranged to receive said semiconductor test data ( 202 ); one or more memories ( 226, 242 ) adapted to store a database comprising said semiconductor test data and a plurality of test data patterns, wherein each of said test data patterns is associated with a corresponding output data value indicating an associated recommendation for modifying said manufacturing process; and at least one processing unit ( 232 ) configured to analyse the values of said semiconductor test data, and/or values derived from said semiconductor test data, to identify a match with at least one of said test data patterns, and to output the corresponding output data value indicating the associated recommendation. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103521463-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8565510-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2012120758-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2022183675-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10318438-B1 |
priorityDate |
2011-06-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |