http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2012267548-A1

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1c09ed2ce2a0c5762fe1aa48f3e4c2bc
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_347cd603ef8bd7665b14337acf566632
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-145
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0422
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J27-20
filingDate 2012-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d5ed5cc48fe7c0198d7122dacb9b50ec
publicationDate 2012-10-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2012267548-A1
titleOfInvention Ionizer for vapor analysis decoupling the ionization region from the analyzer
abstract A method and apparatus are described to increase the efficiency with which a sample vapor is ionized prior to being introduced into an analyzer. Excellent contact between the vapor and the charging agent is achieved in the ionization chamber by separating it from the analyzer by means of a perforated impaction plate. As a result, some desired fraction of the gas going into the analyzer or coming out of the analyzer can be controlled independently from the flow of sample through the ionization chamber. Furthermore, penetration into said ionization chamber of said desired fraction of the gas going into or out of the analyzer is minimized by controlling the dimensions of said perforated impaction plate. Ions formed in the ionization chamber are driven partly by electric fields through said hole in said perforated impaction plate into the inlet to the analyzer. As a result, most of the gas sampled into the analyzer carries ionized vapors, even when the sample flow of vapor is very small, and even when the analyzer uses counterflow gas.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2014197333-A1
priorityDate 2009-01-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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