http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2012201954-A1

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publicationDate 2012-08-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2012201954-A1
titleOfInvention Method of determining multilayer thin film deposition on a piezoelectric crystal
abstract A method for accurately calculating the thickness of deposited thin film layers onto a piezoelectric crystal blank in which dissimilar materials can be utilized, enabling determinations for various applications employing exotic materials. Additionally, the specific acoustic impedance (or equivalent z-ratio) of an unknown deposited material can be determined. The exact analytical solution nearly eliminates thickness errors when several layers of different materials are sequentially deposited on the same monitor quartz crystal.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2014205742-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10446421-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8962067-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104579233-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3062441-A4
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9971341-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2016537875-A
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Total number of triples: 31.