| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_07c7a8f8b3af3a569c435697aeb52e28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9338f8a6d729d45b8dadc0272d866821
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1c5c7d41c8bbe15a59a014d6156120a6
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5fe96b16c8345af50bd4cf259a5a4ace
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fefea45cb82f803a6d1c8914b2a57422
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_421cadb30fc0074fe61126eb980d19d6 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N15-1459
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2015-1409
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2015-1465
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-30 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N35-00613
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N15-1404 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-62 |
| filingDate |
2010-07-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f04c7a12368b4b335d5deddb3f3465d3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_12529ce562b37889b77a37f5f67efd19
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c20c59c862826e7e1461eb54f25d46f4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8f1a794c9720efa7a69f70df5f2bf2e3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6dac0cc8f2a66a86052606fa5c896e0b |
| publicationDate |
2012-05-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2012134559-A1 |
| titleOfInvention |
Particle image analysis apparatus |
| abstract |
The particle analysis apparatus includes means that perform processes upon image processing of images ( 110 ) acquired in a measurement of the sample, simultaneously with a normal image processing for classifying target particles. The means included are: image processing means ( 110 a ) for calculating information of RGB density distributions of each whole image; abnormal state determination processing means ( 110 c ) for determining whether or not the acquired images are in an abnormal state according to tendencies of the RGB density distributions; and an abnormality judgment process means for making final determination of the existence of an abnormality by calculating an appearance frequency of abnormal images after all measurements for the one sample is completed. These means allow diagnosis of abnormalities to be conducted simultaneously with normal analysis without changing the configuration of the conventional apparatus. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10429292-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017368726-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2018356330-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10690583-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11543340-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9951613-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11525766-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9715729-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11360017-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10814534-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017053400-A1 |
| priorityDate |
2009-07-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |