Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_af42a1749aa7420b4aab25591d2a78b2 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ea059ba1550db91375c408c092e60d74 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d6389f28b5746f9b36917e46946a8625 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-1013 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K999-99 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K2203-162 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-005 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-025 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-246 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N9-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-048 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-42 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-203 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N19-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-06 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01V5-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-00 |
filingDate |
2011-12-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e7a46bc89235e769538c3f663172c9cb http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3d8b7cedae117f1aaaf8ad52ed28e692 |
publicationDate |
2012-04-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-2012085899-A1 |
titleOfInvention |
Methods, systems, and computer program products for measuring the density of material including a non-nuclear moisture property detector |
abstract |
The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. A radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function may calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge includes an electromagnetic moisture property gauge that determines a moisture property of the material. An electromagnetic field generator may generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material. An electromagnetic sensor may determine a frequency response of the material to the electromagnetic field across the several frequencies. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9885566-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8878139-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2013221231-A1 |
priorityDate |
2005-08-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |