Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_770f9b8922efd2e1a3b8560e2c91bb8f http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_106fb4b978d5c64d672edbaff4a22b77 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fcc3c5cb46e596e094dd3837f0a42887 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_cb38ec5f43e30a8ce88f2ec1ad835fec http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e726f44d81f927d0c1cdb6540437181d http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7a76b2f4c26c41c365984bc22d3cc618 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fdad00677b9268c26e005a9e03a7b9dd http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_40d334064545688929c069e727f2cbc0 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0b40d96f73fa6fcf7e2125cbb7fa16b6 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-02854 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E30-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0258 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0421 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B2290-25 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-2636 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F22B37-003 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B17-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G21C17-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-043 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-0645 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-07 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G21C17-003 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-2418 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B11-161 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G21C17-017 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-04 |
filingDate |
2011-09-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c272eb990b48059741580b78d1a4585f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f44086fc51c3860d618528d08650b980 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ee21a2b5e446fc645d15c61119911965 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fb3d3813a8c8eb69428c85a81879eab5 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_288350fe8128ebb074bebdc989e5c135 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2c84d94bcdeccf592abdc871486d91db http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b9b07987699d16324569b46fb962809a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_198175adf3d16cb878b0f2fc2ebc8bc3 |
publicationDate |
2012-03-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-2012048021-A1 |
titleOfInvention |
Laser-based maintenance apparatus for inspecting flaws |
abstract |
A surface inspecting method for inspecting a flaw of a test object using a surface wave and estimating a depth of the flaw of the test object from an attenuation ratio of a frequency of a generation wave, the surface inspecting method including calculating a power spectrum of generation wave generating the flaw of the test object; integrating the power spectrum of the generation wave passing the flaw of the test object and calculating an integration value thereof; converting the integration value into a flaw depth based on a calibration created beforehand and calculating the flaw depth of the test object; and displaying the calculated flaw depth of the test object. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8554356-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11639914-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2014143258-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9927404-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010015889-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10207390-B2 |
priorityDate |
2005-07-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |