| abstract |
The invention relates to a method of determining a charged particle concentration in an analyte ( 100 ), the method comprising steps of: i) determining at least two measurement points of a surface-potential versus interface-temperature curve (c 1 , c 2 , c 3 , c 4 ), wherein the interface temperature is obtained from a temperature difference between a first interface between a first ion-sensitive dielectric (Fsd) and the analyte ( 100 ) and a second interface between a second ion-sensitive dielectric (Ssd) and the analyte ( 100 ), and wherein the surface-potential is obtained from a potential difference between a first electrode (Fe) and a second electrode (Se) onto which said first ion-sensitive dielectric (Fsd) and said second ion-sensitive dielectric (Ssd) are respectively provided, And ii) calculating the charged particle concentration from locations of the at least two measurement points of said curve (c 1 , c 2 , c 3 , c 4 ). This method, which still is a potentiometric electrochemical measurement, exploits the temperature dependency of a surface-potential of an ion-sensitive dielectric in an analyte. The invention further provides an electrochemical sensor deny for determining a charged particle concentration in an analyte. The invention also provides various sensors which can be used to determine the charged particle concentration, i.e. EGFET's and EIS capacitors. |