| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4a12cb032d18a0d1ddc6af8852174186 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-278
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-6439 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-276
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-6458
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-6486 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J1-10 |
| filingDate |
2011-01-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ab33c1bd266dcb3a849ad4b68b44f067
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8209e85dce1923939ce843cbad65ff9f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d7ff9e26d5c889e26c3e750549581508
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dc99e31146865b8a45f8a794b78163c7 |
| publicationDate |
2011-05-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2011116087-A1 |
| titleOfInvention |
Method and system for standardizing microscope instruments |
| abstract |
Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110824722-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8120768-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109186458-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9080978-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9240043-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8655037-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010136549-A1 |
| priorityDate |
2007-06-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |