http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010320388-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b9d0431643a8821a088efdecd07080e8 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-108 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-443 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J5-02 |
| filingDate | 2010-05-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c7b5e363cbbe0b77985c0bb8ff95f2dc |
| publicationDate | 2010-12-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-2010320388-A1 |
| titleOfInvention | Microscopic infrared analysis by x-ray or electron radiation |
| abstract | An infrared (IR) emission spectroscopy and microscopy apparatus with X-ray excitation or electron excitation and an improved process for extending spatial relation of infrared (IR) microscopy and performing microscopic infrared (IR) analysis by X-ray or electron radiation are provided. By utilizing nanometer sized X-ray beams or electron beams to produce IR emission, the spatial resolution of IR microscopy is extended. Simultaneously performing X-ray or electron-based spectroscopy as well as structural studies are enabled. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8693626-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11210366-B2 |
| priorityDate | 2009-06-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 22.