http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010315624-A1

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filingDate 2007-11-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2f4e5c0bce40398faab98c0624e48377
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3ea275f828fc362b4275b7b2b1349034
publicationDate 2010-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2010315624-A1
titleOfInvention Device for, an arrangement for and a method of analysing a sample
abstract A device ( 100 ) for analysing a sample, the device ( 100 ) comprising a beam sensitive structure ( 101 ) adapted such that an electric property of a portion of the beam sensitive structure ( 101 ) is locally modified by a beam ( 102 ) impinging on the portion of the beam sensitive structure ( 101 ), and a sample accommodating unit ( 103 ) adapted for accommodating the sample, wherein the beam sensitive structure ( 101 ) and the sample accommodating unit ( 103 ) are arranged such that the local modification of the electric property of the portion of the beam sensitive structure ( 101 ) locally modifies the analysis of the sample in a corresponding portion of the sample accommodating unit ( 103 ), wherein the beam sensitive structure ( 101 ) comprises an organic photoconductor.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010028982-A1
priorityDate 2006-11-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 32.