| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_dbc3e7608ac2c1394aecf40e0e34b852
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_f88c6b030bb47780f242f582daa77b23 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q40-00 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-54
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q40-00 |
| filingDate |
2010-02-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8ba8656a3f581b3cacb9c9911c83349c |
| publicationDate |
2010-09-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2010223697-A1 |
| titleOfInvention |
Systems for assessing and enhancing the performance of scanning probe microscopes by quantifying and enforcing symmetries and periodicities in two dimensions |
| abstract |
Scanning probe microscope (SPM) images are enhanced by enforcing one or more symmetries that can be selected based on suitable Fourier coefficient amplitude or phase angle residuals, and/or geometric Akaike information criteria, and/or cross correlation techniques. Alternatively, this selection can be based on prior knowledge of specimen characteristics. In addition, a scanning microscope point spread function is obtained based on the evaluation of a calibration image by enforcing at least one symmetry and can be applied to other image acquisitions. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10417756-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2016172610-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2018012349-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2012109559-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9075749-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11576563-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101923034-B1 |
| priorityDate |
2009-02-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |