| abstract |
A method, for reducing occurrence of short-circuit failure in an organic functional device ( 101, 201, 401 ) comprising a first transparent electrode layer ( 104 ), a second electrode layer ( 105 ) and an organic functional layer ( 103 ) sandwiched between said first and second electrode layers ( 104; 105 ). The method comprises the steps of identifying ( 301 ) a portion of said organic functional device ( 101, 201, 401 ), said portion containing a defect ( 102 a - g ) leading to an increased risk of short-circuit failure, selecting ( 302 ) a segment ( 108 a - g ) of said second electrode layer ( 105 ), said segment corresponding to said portion, and electrically isolating ( 303 ) said segment ( 108 a - g ) from a remainder of said second electrode layer ( 105 ), thereby eliminating short-circuit failure resulting from said defect ( 102 a - g ). |