| abstract |
The resistance of an integrated circuit against ESD (electrostatic discharge) is improved without disturbing improvement of the performance and reduction of size of the integrated circuit. A protection circuit is interposed between an input and output terminals. When ESD is generated, the input and output terminals are short-circuited by the protection circuit, so that overvoltage application to the circuit is prevented. The circuit is electrically connected to the input and output terminals by a connection wiring. The circuit has a plurality of electrical connection portions between the circuit and the connection wiring, and the connection wiring is formed such that the wiring resistance between the input or output terminal and each of the connection portions is the same. Accordingly, if ESD is generated, voltage application on only one of the connection portions is prevented, whereby the possibility that the circuit will be broken by ESD is decreased. |