http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009071402-A1

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filingDate 2008-11-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2009-03-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2009071402-A1
titleOfInvention Metal film vapor phase deposition method and vapor phase deposition apparatus
abstract A copper film vapor phase deposition method includes the steps of exposing high-purity copper to a plasma of a gas containing chlorine gas to etch the high-purity copper, thereby generating active Cu x Cl y , wherein x is 1 to 3, y is 1 to 3, gas, and forming a copper film by transporting the Cu x Cl y gas onto the surface of a substrate to be processed. By using inexpensive high-purity copper and inexpensive chlorine, hydrogen chloride, or chlorine and hydrogen as source gases, a copper film containing no residual impurity such as carbon and having high film quality can be formed with high reproducibility.
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