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publicationDate 2008-10-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2008237683-A1
titleOfInvention High-k trilayer dielectric device and methods
abstract Methods and structures are described for reducing a gate leakage current and increasing gate coupling ratio in a semiconductor device. In some embodiments, nitride layers are used to limit the oxidation of adjacent silicon gate regions due to oxygen in an intermediate insulator. In various embodiments, the intermediate insulator includes a high-κ dielectric material. Apparatus according to embodiments of the invention are also disclosed.
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