Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c3a2f00e72ba6e4c09b6da573427fbed |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-32139 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0271 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-322 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-302 |
filingDate |
2006-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6ff0e01950a918ef53477d291173f233 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_de63309c9d0d0925ba581c502ca30fee http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_751d2b9c5922c3c5c1ae1f45632f8d02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ddec90878d83bc060a36bc93a8be2ba0 |
publicationDate |
2008-02-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-2008050925-A1 |
titleOfInvention |
Photoresist processing methods |
abstract |
A photoresist processing method includes treating a substrate with a sulfur-containing substance. A positive-tone photoresist is applied on and in contact with the treated substrate. The method includes selectively exposing a portion of the photoresist to actinic energy and developing the photoresist to remove the exposed portion and to form a photoresist pattern on the substrate. The treating with a sulfur-containing substance reduces an amount of residual photoresist intended for removal compared to an amount of residual photoresist that remains without the treating. |
priorityDate |
2006-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |