http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008018355-A1

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filingDate 2007-06-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8e839b93ed29bc11404c15597d0511d2
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publicationDate 2008-01-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2008018355-A1
titleOfInvention Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method
abstract A reliability evaluation test apparatus of this invention includes a wafer storage section which stores a wafer in a state wherein the electrode pads of a number of devices formed on the wafer and the bumps of a contactor are totally in electrical contact with each other. The wafer storage section transmits/receives a test signal to/from a measurement section and has a hermetic and heat insulating structure. The wafer storage section has a pressure mechanism which presses the contactor and a heating mechanism which directly heats the wafer totally in contact with the contactor to a predetermined high temperature. The reliability of an interconnection film and insulating film formed on the semiconductor wafer are evaluated under an accelerated condition.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11187752-B2
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11300472-B2
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11693057-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2014116434-A1
priorityDate 2001-11-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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