http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2007115032-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_827f58bacb8fef905977e1f8b3c7aace |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01K15-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01K3-005 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01K7-015 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03K5-153 |
| filingDate | 2006-06-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0de997e55468f0729b6fc7b6a1104352 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4c96dd18e82d920f4758f0d9a8410eab |
| publicationDate | 2007-05-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-2007115032-A1 |
| titleOfInvention | Test mode and test method for a temperature tamper detection circuit |
| abstract | An integrated circuit temperature sensor includes a sensing circuit operable to determine whether the integrated circuit is currently exposed to one of a relatively low temperature or a relatively high temperature. A selection circuit operates to select a measured voltage across the base-emitter of a bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively low temperature or, alternatively, select a measured delta voltage across the base-emitter of the bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively high temperature. A comparator then compares the selected measured voltage across the base-emitter of the bipolar transistor against a first reference voltage indicative of a too cold temperature condition or compares the selected measured delta voltage across the base-emitter of the bipolar transistor against a second reference voltage indicative of a too hot temperature condition. As a result of the comparison, detection may be made as to whether the integrated circuit is currently exposed to one of either a too cold or too hot temperature. In a test mode, the circuit is exposed to a readily available temperature, such as room temperature, and the measured delta voltage across the base-emitter and/or the measured voltage across the base-emitter are scaled in accordance with that available temperature for application to the comparator. Alternatively, in test mode the reference voltages are scaled to intersect with the measured delta voltage across the base-emitter and/or the measured voltage across the base-emitter at the available temperature. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9329614-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7722247-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8371749-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008084911-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2023067121-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008192804-A1 |
| priorityDate | 2005-11-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 25.