| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_72ed91cb20a3ca510bb7e85d7fae504a |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2029-0403 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-52 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-00 |
| filingDate |
2006-03-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0db9d35d4f4cbf1d0ce46a77b5ca43dd |
| publicationDate |
2007-02-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2007043983-A1 |
| titleOfInvention |
Sample screening method for system soft error rate evaluation |
| abstract |
A sample screening method for system soft error rate evaluation. Memory cells of a memory device are written and read according to a first test condition to locate hard errors. The memory cells of the memory device are read according to a second test condition to locate functional errors. The memory cells of the memory device are read according to a third test condition to locate soft errors. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8661321-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9703630-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9858145-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2014378052-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2016357629-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9344152-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8281215-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10564866-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8694864-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10545824-B2 |
| priorityDate |
2005-08-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |