| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_cf6788c840785c60ac081f938198d235
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c524779f34a7d3ca3591c8560ecb68fc
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6a749606ccab609c3cc121ad811c95c8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8a68871ddf7bdbfa3a8564afebb2b884 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-8967 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-958
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8803
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-88
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M11-00 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-00 |
| filingDate |
2004-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_56809e3f01fde741511db463b6424e73
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_368d873e716057c95c92df1aaccf80bb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_949fb3b50ee8419e5124f28d27a04556
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_96130c84ca8becdc5d48c35cbb529921 |
| publicationDate |
2006-03-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2006066845-A1 |
| titleOfInvention |
System and method for inspecting a light-management film and method of making the light-management film |
| abstract |
A method of inspecting a light-management film comprises reflecting light from an overhead light source off a first side of the light-management film and examining the light-management film for defects; directing transmission light from a backlight source through a second side of the light-management film to the first side and examining the light-management film for defects; reflecting light from the overhead light source off the second side of the light-management film and examining the light-management film for defects; directing transmission light from the backlight source through the first side of the light-management film to the second side and examining the light-management film for defects; and measuring a location of each of the examined defects in the light-management film. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7310136-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2008085156-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2007115465-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2007117225-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7371590-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2007116350-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2008085163-A1 |
| priorityDate |
2004-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |