http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2005087697-A1

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filingDate 2004-10-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b0b7a98fc0976163605af0539878a904
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fb4ad5b01ce38542bef958388b1ce475
publicationDate 2005-04-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2005087697-A1
titleOfInvention Inspection by a transmission electron microscope of a sample
abstract A method of manufacturing a transmission electron microscope inspection sample. The sample is mounted into a recess in the mount and the sample is grinded to a preset target thickness. A recess for mounting the sample and a groove for separating the sample from the recess are formed on a top surface of the mount. The sample is fixed into the recess using mounting wax. The protruding portion of the sample protrudes above the mount and is grinded by the grinder. The depth of the recess is based on the target thickness of the sample. The protruding portion of the sample is grinded to the top surface of the mount.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2006086315-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008165929-A1
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7459397-B2
priorityDate 2003-10-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 30.