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filingDate 2004-08-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2005-03-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2005057230-A1
titleOfInvention Providing Optimal Supply Voltage to Integrated Circuits
abstract A characteristic is measured on multiple portions of an integrated circuit, and the supply voltage adjusted based on the measurements. In an embodiment, the characteristic corresponds to propagation delay which indicates whether the integrated circuit is implemented with a strong, weak or nominal process corner. In general, the supply voltage can be increased in the case of a weak process corner and decreased in the case of a strong process corner.
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