Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1af8df51ce24ca931ae718fb747f6aa0 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C12M99-00 |
classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q70-06 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q30-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q70-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C12M1-34 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q80-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q70-18 |
filingDate |
2003-06-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_54e4a3a262f25ac997bfa23dea3e345e |
publicationDate |
2004-03-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-2004053308-A1 |
titleOfInvention |
Probe immobilized substrate and method for manufacturing the same, and analytical method |
abstract |
The present invention provides a probe immobilized substrate and a method for manufacturing the same, wherein the probe is able to be analyzed without any problems using various surface analysis methods, sampling inspection loss becomes minimum, and target substances are able to be promptly and cheaply detected and quantified. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9274431-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2016032281-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2005014291-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2015276369-A1 |
priorityDate |
2002-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |