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filingDate 2001-11-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_715a3c8c23494b886c79ad08d1120949
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publicationDate 2004-02-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2004026403-A1
titleOfInvention Ceramic heater for semiconductor manufacturing and inspecting devices
abstract An object of the present invention is to provide a ceramic heater for a semiconductor-producing/examining device which has a short temperature dropping time and can be rapidly cooled. The present invention is a ceramic heater for a semiconductor-producing/examining device comprising a resistance heating element on a surface thereof, wherein the resistance heating element has a surface roughness Ra according to JIS B 0601 of 0.01 μm or more.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2004099708-A1
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2005153826-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2005231829-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010242577-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2006088692-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2005008835-A1
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priorityDate 2000-11-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 49.