| Predicate |
Object |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-396
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-378 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R19-16542
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-388 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-385
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M4-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-48
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M6-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M6-50 |
| filingDate |
2002-10-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d11118d20bf26bb23abacaf8bc3ca1ae |
| publicationDate |
2003-05-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2003088378-A1 |
| titleOfInvention |
Method for determining poor performing cells |
| abstract |
A means for determining long-term discharge performance, particularly in a lithium/silver vanadium oxide cell, by analyzing and characterizing the initial pulse voltage waveform, is described. The relationship between the initial P 1 (P min ) voltage drop and the extent of that initial voltage drop with P last (the final voltage under load) is a reliable indication of long-term discharge performance. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010310907-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7263449-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2007079701-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8669007-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8663825-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7947109-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010221616-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104345278-A |
| priorityDate |
2001-10-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |