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publicationDate 2003-05-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2003085467-A1
titleOfInvention Plating method, plating solution, semiconductor device and process for producing the same
abstract A plating method comprising using a plating solution containing an additive satisfying the following conditions: n 0.005× h 2 /W<D/κ<0.5×h 2 /w, n and n 0.01≦Θ≦0.7 n wherein D is a diffusion coefficient of the additive; κ is a surface reaction rate of adsorption or consumption of the additive; h is a height of a trench or hole; w is the width of the trench or the radius of the hole; and Θ is a ratio of (plating film growth rate in the presence of additive)/(plating film growth rate in the absence of additive), is suitable for forming the plating metal in the trench or hole having the width of 1 μm or less (trench) or the radius of 1 μm or less (hole) without generating voids, and particularly suitable for producing semiconductor devices, which can have a multilayer structure of copper wiring layers formed on a semiconductor substrate by using the plating conditions, wherein at least one layer of copper wiring layers is plated in different conditions from the rest of the copper wiring layers.
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Total number of triples: 49.