http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2003019282-A1

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M3-186
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filingDate 2002-07-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_98fd16817142d95cba69aed1ab072b4c
publicationDate 2003-01-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2003019282-A1
titleOfInvention Method for seal testing capacitive sensors
abstract 1. Method for testing the tightness of capacitive sensors n 2.1. Known methods of seal testing cannot be used because of the extremely small volume of the sensor cavity or on wafer level. Other known methods of seal testing are only possible with high expenditure on safety because, for example, radio isotopes are used. n 2.2. Method for testing the tightness of capacitive sensors arranged in a hermetically sealed enclosure, in which the processed sensors are arranged in the form of a wafer, wherein the already sawn wafer bearing the sensors is immersed in a test fluid under defined conditions, the capacitance of each sensor is then measured and compared with the capacitance of reference sensors. n 2.3. The invention is especially suitable for testing the tightness of capacitive, hermetically sealed sensors.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8579502-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-115026013-A
priorityDate 2001-07-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 22.