http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2002179996-A1

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filingDate 2002-07-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2002-12-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2002179996-A1
titleOfInvention Semiconductor device having a nitride barrier for preventing formation of structural defects
abstract Providing a method of producing a semiconductor device and a structure of the semiconductor device employing a trench isolation structure for isolating semiconductor elements wherein volumetric expansion of a trench-filling material due to oxidation process after forming the trench isolation structure is controlled thereby making it possible to prevent deterioration of the electrical characteristics of the semiconductor device. n A nitriding treatment is applied to the trench surface of the silicon substrate after forming the trench by etching, thereby to form a thin nitride layer having a better effect of preventing oxidation in the interface of silicon.
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priorityDate 1998-10-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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