| Predicate |
Object |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06727
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2648
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06711
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06755
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2831 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07307
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06733 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-04 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-14 |
| filingDate |
2000-12-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7927cbd25664bdd50f4b3e64830b80b1
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8eec6cd3f09c40c94a8c318f9fe6142d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2a815b4445238fd34f945c32ae2d23e9 |
| publicationDate |
2001-12-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2001050565-A1 |
| titleOfInvention |
Multi-point probe |
| abstract |
An object of the present invention is to provide a novel testing probe allowing the testing of electronic circuits of a smaller dimension as compared to the prior art testing technique. A particular advantage of the present invention is related to the fact that the novel testing technique involving a novel multi-point probe allows the prove to be utilized for establishing a reliable contact between any testing pin or testing tip and a specific location of a test sample, as the testing probe according to the present invention includes individually bendable or flexible testing pins. A particular feature of the present invention relates to the fact that the testing probe according to the present invention may be produced in a process compatible with the production of electronic circuits, allowing measurement electronics to be integrated on the testing probe, and allowing for tests to be performed on any device fabricated by any appropriate circuit technology involving planar technique, thick-film technique or thin-film technique and also LSI an VLSI production techniques. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8836358-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11125779-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010176829-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2010176396-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11444142-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2015042367-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-03060529-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2022373583-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11693028-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-2088420-A4
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8507908-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111316110-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2012119770-A1 |
| priorityDate |
1998-07-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |