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filingDate 2001-02-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c896392ebda5ca1f54e8dbf77938374c
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publicationDate 2001-10-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2001025826-A1
titleOfInvention Dense-plasma etching of InP-based materials using chlorine and nitrogen
abstract A semiconductor dry etching process that provides deep, smooth, and vertical etching of InP-based materials using a chlorinated plasma with the addition of nitrogen (N 2 ) gas. Etching of InP-based semiconductors using an appropriate Cl 2 /N 2 mixture without any additional gases provides improved surface morphology, anisotropy and etch rates.
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Total number of triples: 44.