| abstract |
Methods and devices for detecting incident radiation, such as incident X-rays, gamma-rays, and/or alpha particle radiation are provided. The methods and devices use high purity, high quality single-crystals of inorganic semiconductor compounds, including solid solutions, having the formula AB 2 X 5 , where A represents Tl or In, B represents Sn or Pb, and X represents Br or I, as photoelectric materials. |