Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1229111a198f86af4112ecd730b55cd9 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-4411 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30148 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J5-0007 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-62 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C30B35-007 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C01B33-035 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01K1-143 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67248 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C30B29-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0004 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J5-48 |
classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C16-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J5-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C16-44 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-67 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J5-48 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-62 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00 |
filingDate |
2017-12-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2022-11-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b7706edcf7f1690f5adb0a65145cbcb6 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e4ec2d86a41260bb027077481c2efd53 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ce2de92cfb2e10a7ef79c130c42dc490 |
publicationDate |
2022-11-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-11515184-B2 |
titleOfInvention |
Method for determining a surface temperature |
abstract |
Siemens process rod growth is controlled by measuring rod diameter by a measuring system A and measuring rod temperature by a measuring system B, the two measuring systems located at different positions outside the reactor. |
priorityDate |
2017-12-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |