http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11428722-B2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a90e73a869c03a3c99350ce7a877c252 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-02 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-08 |
| filingDate | 2020-12-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2022-08-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a5ef1d2edd932607166ad681b77ec1c7 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0207295faca007e05c4a53a0b9eaed14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_192d758d963f0e75be1fa47029830dcf http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5d0b1d0c04bf0de1d3c8acca598ad5f8 |
| publicationDate | 2022-08-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-11428722-B2 |
| titleOfInvention | Resistance test method using kelvin structure |
| abstract | The disclosure discloses a resistance test method using a Kelvin structure, which includes the following steps: step 1: providing a Kelvin test structure including a tested resistor, a first parasitic resistor, and a second parasitic resistor connected in series; step 2: applying first current to the two current test terminals and simultaneously testing first voltage in the two voltage test terminals; step 3: applying second current in a direction opposite to the direction of the first current to the two current test terminals and simultaneously testing second voltage in the two voltage test terminals; step 4: dividing a difference value obtained by subtracting the second voltage from the first voltage by a difference value between the first current and the second current to obtain the final test value of the tested resistor. The disclosure can reduce the resistance test error. |
| priorityDate | 2019-12-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123 |
Total number of triples: 20.