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publicationDate 2022-08-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-11399713-B2
titleOfInvention Measurement of multi-layer structures
abstract Systems and methods for assessing multi-layer structures in which a spectrum array is generated from low coherence interferometry and input into a statistical estimator, which determines the thickness and layer number based on the inputted spectrum and other information, including information about a source intensity noise, Poisson noise, and dark noise associated with the low coherence interferometry.
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