| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_268be9afa00cf55b5aa72b1612151ecb |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30164
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20081
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-628
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30108
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20056
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-8883
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2200-24
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-401 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-214
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0004
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V10-764
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N20-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8851
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V10-82
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06K9-6256
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V10-145 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-88
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06V10-145
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06N20-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06V10-764 |
| filingDate |
2020-03-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2022-07-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a4a1177353f8e6226c8e97bb0dac89bd |
| publicationDate |
2022-07-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-11386542-B2 |
| titleOfInvention |
Training data creation method and device, and defect inspection method and device |
| abstract |
Provided are a training data creation method and device, and a defect inspection method and device capable of securing the accuracy of defect inspection even though the number of samples of a defect to be used in creating training data is small. n The training data creation method includes acquiring a training-use image including a received light image created based on reflected light or transmitted light from an inspection object having a defect obtained by irradiating the inspection object with light rays or radiation, executing frequency distribution analysis on the training-use image, receiving an input of a parameter for designating a frequency bandwidth, selecting a frequency bandwidth signal from an analysis result of the frequency distribution analysis according to the frequency bandwidth designated by the parameter, acquiring defect information indicating a defect for an image corresponding to the frequency bandwidth signal, and creating training data to be used in learning of a defect inspection device, which inspects a defect of the inspection object, based on the defect information. |
| priorityDate |
2017-09-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |