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filingDate 2019-07-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2022-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2022-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-11374126-B2
titleOfInvention FinFET structure with fin top hard mask and method of forming the same
abstract Semiconductor device and the manufacturing method thereof are disclosed herein. An exemplary semiconductor device comprises a semiconductor fin disposed over a substrate, wherein the semiconductor fin includes a channel region and a source/drain region; a gate structure disposed over the channel region of the semiconductor fin, wherein the gate structure includes a gate spacer and a gate stack; a source/drain structure disposed over the source/drain region of the semiconductor fin; and a fin top hard mask vertically interposed between the gate spacer and the semiconductor fin, wherein the fin top hard mask includes a dielectric layer, and wherein a sidewall of the fin top hard mask directly contacts the gate stack, and another sidewall of the fin top hard mask directly contacts the source/drain structure.
priorityDate 2018-09-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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