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filingDate 2020-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2021-12-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_148ccb70a31b774cd1052eac545be7c4
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publicationDate 2021-12-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-11195934-B2
titleOfInvention Structure and method for bi-layer self-aligned contact
abstract The present disclosure provides embodiments of a semiconductor structure having bi-layer self-aligned contact. The semiconductor structure includes a gate stack disposed on a semiconductor substrate and having a first height, a spacer disposed on a sidewall of the gate stack and having a second height greater than the first height, and a first etch stop layer disposed on a sidewall of the gate spacer and having a third height greater than the second height. The semiconductor structure further includes a first dielectric layer disposed over the gate stack and contacting the gate spacer and the first etch stop layer and a second dielectric layer disposed on the first dielectric layer and contacting the first etch stop layer.
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