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filingDate 2019-09-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2021-11-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b90232432b1b2a1f0cdb01aa84d55af9
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publicationDate 2021-11-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-11183581-B2
titleOfInvention Vertical field effect transistor having improved uniformity
abstract A semiconductor device structure and method for fabricating the same. The semiconductor device structure includes a semiconductor fin and a liner in contact with end portions of the semiconductor fin. A first source/drain contacts the liner and sidewalls of the semiconductor fin. A gate structure is in contact with and surrounds the semiconductor fin. A second source/drain is formed above the first source/drain. The method includes forming, on a substrate, at least one semiconductor fin having a first spacer in contact with an upper portion of the semiconductor fin, and a second spacer in contact with the first spacer and a lower portion of the semiconductor fin. The semiconductor fin is patterned into a plurality of semiconductor fins. A liner is formed on exposed end portions of each semiconductor fin of the plurality of semiconductor fins.
priorityDate 2019-02-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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