http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11133168-B2
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b36e0147a7847963b1ed46315343a5a6 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-714 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0409 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-105 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-049 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0031 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05H1-46 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-102 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05H1-46 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-71 |
filingDate | 2017-10-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 2021-09-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8b6108dcb9d718b0133661f3d87c7b32 |
publicationDate | 2021-09-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | US-11133168-B2 |
titleOfInvention | Method for spectrometry |
abstract | The invention relates to a method for the spectrometry, in particular mass spectrometry, ion-mobility spectrometry, or optical emission spectroscopy, of a sample, comprising the following steps: providing a solid-state generator for generating a high-frequency signal, having a control element for varying the power and/or frequency of the signal, providing a plasma ignition head fed by the signal for generating a plasma jet, applying the plasma jet to a sample, performing a first measuring operation, wherein the plasma jet is generated with a first power of the solid-state generator and a spectrum emitted by the sample, preferably charged ions and/or optical spectrum, is recorded by means of a spectrometer, wherein the first power leads to a soft ionization of the sample, and performing a second measuring operation on the same sample, wherein the plasma jet is generated with a second power of the solid-state generator and a spectrum emitted by the sample, preferably charged atoms and/or optical spectrum, is recorded by means of the spectrometer, wherein the second power leads to a hard ionization of the sample. |
priorityDate | 2016-10-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 53.