http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11031462-B1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b2d32a1324eb3a240649ffee8d475d63 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76224 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-5286 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-8611 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-481 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76898 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-761 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-417 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-585 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-0619 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-764 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-48 |
| filingDate | 2019-12-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2021-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2ad1529bddff4ce70dc12fca863efc21 |
| publicationDate | 2021-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-11031462-B1 |
| titleOfInvention | Semiconductor structure with improved guard ring structure |
| abstract | A semiconductor structure includes a semiconductor wafer having a topside and a backside. The wafer includes a first semiconductor well of a first conductive type, a second semiconductor well of a second conductive type different from the first conductive type, a plurality of first semiconductor doped regions of the first conductive type and a plurality of first through silicon vias (TSVs) filled with conductive material. The first semiconductor well is formed within the second semiconductor well and exposed to the topside. The semiconductor device and the first semiconductor doped regions are formed within the first semiconductor well, and the first semiconductor doped regions surround the semiconductor device. Each first TSV extends into a corresponding one of the first semiconductor doped regions from the backside through the first and second semiconductor wells and is connected to a DC voltage or a ground potential from the backside. |
| priorityDate | 2019-12-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 27.