| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2a819eda0adf22936a52362eeebb9fb4 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67288
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-02 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-36
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0016
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2656
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-08 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-67 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-36
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-265
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
2019-04-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2021-04-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3a0be2f27825559fc144fbe41d962634
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_774b063a09c44d5ef9c2567f7adc8210 |
| publicationDate |
2021-04-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-10989756-B2 |
| titleOfInvention |
Systems and methods using stroboscopic universal structure-energy flow correlation scattering microscopy |
| abstract |
The disclosure provides for systems and methods which utilize an optical scattering microscope with a spatiotemporal approach to measure the nature and extent of energy flow across electronic or semiconductor materials. |
| priorityDate |
2018-04-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |