| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0e433c1625fc509a087c912b440da84b |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31723
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318577
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318505
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3177
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3185
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3177
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-317 |
| filingDate |
2020-02-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2021-01-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fd89c3f91093f85a8b1520c265a96f56
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fb9c8d74c9abe50dd28fcd4c1bfa3d6b |
| publicationDate |
2021-01-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-10901034-B2 |
| titleOfInvention |
TSVS, test circuits, scan cells, comparators, electrical source, and resistor |
| abstract |
This disclosure describes a novel method and apparatus for testing TSVs within a semiconductor device. According to embodiments illustrated and described in the disclosure, a TSV may be tested by stimulating and measuring a response from a first end of a TSV while the second end of the TSV held at ground potential. Multiple TSVs within the semiconductor device may be tested in parallel to reduce the TSV testing time according to the disclosure. |
| priorityDate |
2012-03-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |