http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10802827-B2

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filingDate 2019-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2020-10-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6d33009cfff6764b9d2b527c42bf9a00
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publicationDate 2020-10-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-10802827-B2
titleOfInvention Memory device having in-situ in-memory stateful vector logic operation
abstract An in-situ in-memory implication gate is disclosed. The gate include a memory cell. The cell includes a first voltage source, a second voltage source lower in value than the first voltage source, a first and second magnetic tunneling junction devices (MTJ) selectively juxtaposed in a series and mirror imaged relationship between the first and second sources, each having a pinned layer (PL) in a first direction and a free layer (FL) having a polarity that can be switched from the first direction in which case the MTJ is in a parallel configuration presenting an electrical resistance to current flow below a first resistance threshold to a second direction in which case the MTJ is in an anti-parallel configuration presenting an electrical resistance to current flow higher than a second resistance threshold, and further each having a non-magnetic layer (NML) separating the PL from the FL.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11250896-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11514963-B2
priorityDate 2018-02-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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