Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_33c922e05f6133b7d72dbb849d77487d |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-0404 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E60-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02P70-50 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-0525 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-36 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-0404 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-48 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3865 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-446 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-4285 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-388 |
classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-04 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-48 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-36 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-385 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-388 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-44 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-42 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-0525 |
filingDate |
2018-01-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2020-10-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_65ee34b56596483a95b12baaa1a737fa http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4b10146da692403b131ecb908d0e4a97 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ecc6db189d949199bf73eef34dd963a8 |
publicationDate |
2020-10-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-10794960-B2 |
titleOfInvention |
Method and apparatus for detecting low voltage defect of secondary battery |
abstract |
Disclosed is a technique for effectively detecting a low voltage defect that may occur at a secondary battery. n A method for detecting a low voltage defect of a secondary battery includes an assembling step of assembling a secondary battery by accommodating an electrode assembly, in which a positive electrode plate and a negative electrode plate are stacked with a separator being interposed therebetween, and an electrolytic solution in a battery case; a primary aging step of aging the assembled secondary battery at a temperature of 20° C. to 40° C.; a primary formation step of charging the aged secondary battery at a C-rate of 0.1 C to 0.5 C; a high-rate charging step of charging the secondary battery at a C-rate of 2 C or above, after the primary formation step; and a detecting step of detecting a defect of the secondary battery, after the high-rate charging step. |
priorityDate |
2017-01-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |