http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10734945-B1

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inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3051c3ce3aca2661a0111063d9349f70
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publicationDate 2020-08-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-10734945-B1
titleOfInvention Potential induced degradation test apparatus for solar cell and the method thereof
abstract A potential induced degradation test apparatus for a solar cell includes a PID test chamber ( 101 ), a mounting unit ( 110 ), one or more PID supply means of a PID test sheet ( 120 ) or a PID-causing substance supply unit ( 140 ), a heating unit ( 130 ), a voltage applying unit ( 150 ), and a PID measuring unit ( 160 ). The potential induced degradation test apparatus is capable of quantifying a level of a cell and durability against PID of individual configurational members such as an encapsulant of a solar cell module by a method of directly applying solid Na and vaporized Na ions quantified by minimum cell unit in a method in which large-area modularization of the solar cell module is not performed.
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