http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10690591-B2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4008e4a2500d9673afd2464a1915a70b |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-12776 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-124 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-12723 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-274 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-31 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-31 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-27 |
| filingDate | 2016-08-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2020-06-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f7b28b8ec71e545edd0efeab9a668246 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_928cfbbb48b0556221355ff405254147 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_edba71d1b9e4129deb7a84b432fc22c0 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3b9787a1e2c7af97aaba4e7e5940020e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3ff466bbce6d00ea6c5c26cb75079724 |
| publicationDate | 2020-06-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-10690591-B2 |
| titleOfInvention | Measurement time distribution in referencing schemes |
| abstract | Methods and systems for measurement time distribution for referencing schemes are disclosed. The disclosed methods and systems can be capable of dynamically changing the measurement time distribution based on the sample signal, reference signal, noise levels, and SNR. The methods and systems can be configured with a plurality of measurement states, including a sample measurement state, reference measurement state, and dark measurement state. In some examples, the measurement time distribution scheme can be based on the operating wavelength, the measurement location at the sampling interface, and/or targeted SNR. Examples of the disclosure further include systems and methods for measuring the different measurement states concurrently. Moreover, the systems and methods can include a high-frequency detector to eliminate or reduce decorrelated noise fluctuations that can lower the SNR. |
| priorityDate | 2015-09-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 30.