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filingDate 2018-07-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2020-05-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0cdd37af1c30cf7f6c003040f284e08b
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publicationDate 2020-05-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-10658461-B2
titleOfInvention Nanowire with sacrificial top wire
abstract Methods for forming field effect transistors include forming a stack of nanowires of alternating layers of channel material and sacrificial material, with a top layer of the sacrificial material forming a top layer of the stack. A dummy gate is formed over the stack. Channel material and sacrificial material of the stack of nanowires is etched away outside of a region covered by the dummy gate. The sacrificial material is then selectively etched to form recesses in the sacrificial material layers. Spacers are formed in the recesses in the sacrificial material layers. The dummy gate is etched away with an anisotropic etch. The sacrificial material is etched away to expose the layers of the channel material. A gate stack is formed over and around the layers of the channel material.
priorityDate 2016-02-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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