http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10444142-B2

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filingDate 2018-04-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2019-10-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ffc416b943b855889af2bbb56686af0b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0131380a6426acc7c30c9f813c0a17d9
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a8d5bcba02e242872192ae38133eae0c
publicationDate 2019-10-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-10444142-B2
titleOfInvention Spectroscopic device and method for sample characterization
abstract The invention relates to a characterization device ( 50 ) for characterizing a sample (S) comprising:n a memory (MEM) storing a measured spectrum (A s+p ) of said sample, performed through a translucent material, and a measured spectrum of the translucent material (A p ), a processing unit (PU) configured to:n determine a spectral energy (E s+p ) of the measured spectrum (A s+p ) of the sample through the translucent material (A s+p ), estimate a coefficient ({circumflex over (γ)}) from said spectral energy (E s+p ) and, determine a corrected spectrum (Â s ) of the sample from the measured spectrum (A s+p ) of the sample through the translucent material and from a corrected spectrum of the translucent material (Â p ),n nsaid corrected spectrum of the translucent material (Â p ) being determined from the measured spectrum of the translucent material (A p ) and from the estimated coefficient ({circumflex over (γ)}).
priorityDate 2017-04-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 39.