| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_91943488b68ac64c91e5a094819621d6 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E10-50 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02S50-15 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-64
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L31-0687
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-146
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H02S50-15
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L31-0304
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-35
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-00 |
| filingDate |
2016-09-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2019-07-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f98a63f72cbf2d5b56c80f68e075cebc
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3989275fee09a8ea2d48100cde50276e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_090d6d120c2623c231cdd3858646cd9c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2307397b7a135e8df269eb5d7088f683 |
| publicationDate |
2019-07-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-10361655-B2 |
| titleOfInvention |
Electrical inspection method for solar cells |
| abstract |
The present invention discloses an electrical inspection method for solar cells, comprising steps of supplying a voltage and a current to a solar cell for stimulating the solar cell and giving a ray of light; filtering the light to give a ray of light having a predetermined wavelength; and measuring an optical power value of the light having a predetermined wavelength. The electrical inspection method adopts a low-cost apparatus to replace the solar simulators according to the prior art. In addition to saving costly equipment, filter adjustment, and the maintenance fee for replacing lamps, the defect inspection flow for solar cells can be further integrated and hence improving the efficiency. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I783507-B |
| priorityDate |
2016-09-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |